Atomic-Scale Imaging of Organic-Inorganic Hybrid Perovskite Using Transmission Electron Microscope

Transmission electron microscope (TEM) is thought as one powerful tool to imaging the atomic-level structure of organic inorganic hybrid perovskite (OIHP) materials, which provides valuable and essential guidance toward high performance OIHP-related devices. However, these OIHPs exhibit poor beam stability, severely limiting their practical applications in TEM. Here this article, application TEM obtain atomic-scale image OIHPs, main obstacles identifying degradation product future prospects characterization OIHP materials are reviewed presented. Three potential strategies (sample protection, low temperature technology, low-dose technologies) also proposed overcome current drawback technology.